A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage

王杭州; 陈丙珍; 何小荣; 邱彤; 章龙江

doi:10.1016/S1004-9541(08)60036-1

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A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage

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- A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage
- A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage
- 中国化学工程学报（英文版） 2008年16卷第1期页码：52-56
- Affiliations：
  
  1. Department of Chemical Engineering, Tsinghua University,Beijing,China,100084
  2. Chemicals & Marketing Company, Petro China Company Limited,Beijing,China,100011
- Author bio：
- Funds：
- DOI：10.1016/S1004-9541(08)60036-1
  中图分类号：
- 纸质出版：2008
- Accepted：
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王杭州, 陈丙珍, 何小荣, 等. A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage[J]. 中国化学工程学报（英文版）, 2008,16(1):52-56.

WANG Hangzhou, CHEN Bingzhen, HE Xiaorong, QIU Tong, ZHANG Longjiang. A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage[J]. , 2008, 16(1): 52-56.
王杭州, 陈丙珍, 何小荣, 等. A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage[J]. 中国化学工程学报（英文版）, 2008,16(1):52-56. DOI： 10.1016/S1004-9541(08)60036-1.

WANG Hangzhou, CHEN Bingzhen, HE Xiaorong, QIU Tong, ZHANG Longjiang. A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage[J]. , 2008, 16(1): 52-56. DOI： 10.1016/S1004-9541(08)60036-1.

摘要

Abstract

Digraph-based causal models have been widely used to model the cause and effect behavior of processsystems. Signed digraphs (SDG) capture the direction of the effect. It should be mentioned that there are loops in SDG generated from chemical process. From the point of the inherent operability

the worst unsafe factor is the SDG having positive loops that means any disturbance occurring within the loop will propagate through the nodesone by one and are amplified gradually

so the system may lose control

which may lead to an accident. So findingthe positive loops in a SDG and treating these unsafe factors in a proper manner can improve the inherent safety of a chemical process. This article proposed a method that can detect the above-mentioned unsafe factors in the process conceptual design stage automatically through the analysis of the SDG generated from the chemical process. Acase study is illustrated to show the working of the algorithm

and then a complicated case from industry is studiedto depict the effectiveness of the proposed algorithm.

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